List of ILTSR PAS equipment
| MAGNETIC MEASUREMENT EQUIPMENT | ||||
|---|---|---|---|---|
| No. | Apparatus | Temperature range | Magnetic field | Possible measurements |
| 1 | Quantum Design MPMS-5 magnetometer | 1.7-400 K (with oven: 300-800 K) | up to 5 T | ——– |
| 2 | Quantum Design MPMS XL-7 magnetometer | 1.7-400 K (with 3He iQuantum cryostat: 0.5-4 K) | up to 7 T | DC, AC (0.1 Hz – 1kHz, up to 10 Oe) and RSO (0.5-4 Hz) |
| 3 | Quantum Design PPMS-9 platform | 1.8-400 K (with 3He cryostat: 0.35 – 350 K) | up to 9 T | specific heat and electrical transport measurements |
| 4 | Quantum Design PPMS-14 platform | 1.8-400 K (with 3He-4He cryostat: 0.050-4 K) | up to 14 T | specific heat and electrical transport measurements |
| 5 | Simultaneous thermal analyzer Netzsch STA 449 F3 Jupiter | ~20°C – 2400°C (with tungsten furnace) | ——– | differential thermal analysis (DTA) and thermogravimetry (TG); differential scanning calorimetry (DSC) also possible after upgrade |
| 6 | Mossbauer Spectrometer (Elektronika Jądrowa – Kraków) | 300 – 1000 K | ——– | transmission geometry and convention electron technique |
| 7 | Mossbauer Spectrometer (Spectromag Oxford Instruments) | 1.5-300 K | up to 8 T | transmission geometry and convention electron technique |
| OPTICAL MEASUREMENT EQUIPMENT | ||
|---|---|---|
| No. | Excitation source | Wavelength |
| 1 | YAG:Nd, pulsed work PW | 266 nm (4th harmonic) 355 nm (3rd harmonic) 532 nm (2nd harmonic) |
| 2 | Argon laser, continuous work CW | 456 nm, 488 nm and 514 nm |
| 3 | Laser diodes (50mW – 8W) | 266 nm, 375 nm, 400 nm, 405 nm, 450 nm, 655 nm, 808 nm, 940 nm, 975 nm, 1064 nm, 1530 nm |
| No. | Apparatus | Characteristic | Possible measurements |
|---|---|---|---|
| 1 | Jobin-Yvon HR1000 monochromator | provided with a CCD camera equipped with 1200 lines/mm blazed at 500 nm in VIS range and in the 800-1700 nm range with a CCD IDUS near-infrared InGaAs camera from ANDOR equipped with a 900 line/mm grating blazed at 1300 nm and Cryostat 10K-300K | luminescence and kinetics measurements |
| 2 | Edinburgh Instrument FLS980 Spectrometer | 450W Xenon lamp as excitation source Wavelength range: 200-1700 nm Integration Sphere to Quantum Yield measurement |
emission, excitation, luminescence kinetics, quantum yield |
| 3 | Raman confocal microscope Renishaw inVia | Measurement range: 100-3200 cm-1 Excitation source: 514 nm and 830 nm laser line Spatial resolution: 1μm | Raman spectra |
| 4 | Agilent Cary 5000 UV-VIS-NIR Spectrophotometer | Wavelength range 175-3300 nm Agilent Cary Universal Measurement Accessory to measure Refractive Index |
transmittance, reflectance and refractive index |
| 5 | Malvern Zetasizer Nano ZS | Size measurement using patented NIBS (Non-Invasive Back Scatter) technology. Zeta potential using patented M3-PALS technology |
size measurement from 0.3nm (diameter) to 10 microns and zeta potential |
| 6 | Keithley 2010 multimeter | detection | setup for photoconductivity measurements |
| 7 | Setup with Linkam Temperature controlled stages | Temperature range: 77K-600K | luminescence spectra measurements |
| 8 | Coherent Libra femtosecond laser system coupled with a Light Conversion OPerA Optical Parametric Amplifier | Emission spectra range: 350-880 nm Excitation range: 260-3000 nm Time resolution: 14 ps |
emission, excitation |